GDMS

Analysis and Characterization of Metals and Semiconductors by GDMS and SSMS

用辉光放电质谱法和火花源质谱法分析表征金属和半导体

Result proves that GDMS is widely applicable the electric system of high request on data connection and data share .

结果表明，GDMS系统是广泛适用于对数据互连和数据共享具有较高要求的电力系统的。

Determination of 23 Elements in Ultra-high Purity Ge by GDMS

辉光放电质谱仪测定超纯锗中23种痕量杂质元素

The managing parameter which faces graphic library of bridge crane has been set up - gdms graphic data manage system

桥式起重机图形库建立中的参数管理&一个面向图形参数管理的GDMS的建立

The principle , structure , features and the applications of glow discharge mass spectrometer ( GDMS ) developed in recent years have been introduced .

本文介绍近年发展的辉光放电质谱计的原理、结构、特性及其应用。

DETERMINATION OF TRACE ELEMENT IN ULTRA-HIGH PURITY CADMIUM BY GDMS Preparation of super pure CdCl_2 · 2.5H_2Oby using chromatography

辉光放电质谱仪直接测定超高纯镉中的痕量杂质元素高纯氯化镉的色谱法制备

As a direct solid sampling technique , glow discharge mass spectrometry ( GDMS ) has been widely applied to the trace element analysis of conductors and semi-conductors .

辉光放电质谱法（GDMS）作为一种固体样品直接分析技术，已广泛应用于金属、半导体等材料的痕量和超痕量杂质分析。

A procedure for determinating 23 elements in ultra-high purity Ge by Glow Dis-charge Mass Spectrometer ( GDMS ) is reported in this paper .

本文报导了一种用辉光放电质谱仪VG9000在无标准样品的情况下对超纯半导体材料锗中23种痕量杂质元素的直接而快速的定量测定方法。

The trace elements of fourteen kinds of Mg , Si , S , Mn , ect . , in high purity Sb were analyzed by glow discharge mass spectrometer ( GDMS ) .

采用辉光放电质谱法（GDMS）对高纯半导体材料锑中的Mg、Si、S、Mn等14种痕量杂质元素进行测量。