边界扫描

基于边界扫描技术的板级BIT设计及测试策略

Design Method of PCB Built-in Test and Testing Strategy Based on Boundary Scan Technology

基于边界扫描的板级BIT技术研究现状及发展趋势

Research Status and Trend of Board - Level BIT Technique Based on Boundary Scan

一种基于边界扫描的FPGA测试优化生成算法

An optimal FPGA test algorithm based on boundary scan architecture

基于边界扫描的FPGA等权值抗误判测试算法

An equal-weight wrong-estimate algorithm for FPGA test based on boundary scan architecture

边界扫描技术作为一种新兴的BIT技术，在工业界内得到了广泛的应用。

As a kind of new developing BIT technology , Boundary scan technology is widely used in industry .

板载FPGA芯片的边界扫描测试设计

Boundary-scan Test Design for FPGA Chip on Board

边界扫描测试中TAP控制器设计

The Design of TAP Controller in the Boundary - Scan Test

边界扫描主控器MCU设计与实现

Design and Implementation of MCU for Master Controller of BS Test

界扫描测试仪的USB驱动程序设计。USB驱动程序实现设备的枚举和完成应用程序对边界扫描测试仪的通信请求等方面的功能。

USB driver design for the boundary-scan tester .

边界扫描在PCB缺陷测试中的应用

Application of Boundary Scan Test Technique in PCB Failure Test

基于边界扫描技术的TAP接口研究

Research of TAP Interface Based on Boundary-scan Technique

基于PCI总线的超大规模集成电路边界扫描测试系统

VLSI Boundary-scan Test System Based on PCI Bus

基于边界扫描的VLSI互连网络故障诊断研究

Research of VLSI Interconnection Fault Diagnosis Based on Boundary Scan

在边界扫描协议的实现过程中，TAP控制器的地位比较突出，是非常重要的一块。

In the process of the boundary-scan standard implementation , Tap controller is outstanding and important .

边界扫描可测性设计及其VHDL描述

Boundary Scan Design for Testability and Its Description Language VHDL

边界扫描技术及其在VLSI芯片互连电路测试中的应用

Boundary Scan Technology and Its Application on VLSI Chip 's Interconnection Circuit Test

VLSI边界扫描测试故障诊断及其策略研究

Research on the Boundary-Scan Test Bus Fault Diagnosis and Its Strategy for VLSI

基于边界扫描技术的VLSI芯片测试系统的设计与实现

Design and Implementation of a VLSI Chip Test System Based on Boundary-Scan Test

边界扫描互连网络测试技术是检测PCB板固定故障的一种有效方法。

Testing technique of interconnect network based on boundary scan is effective in solving these problems .

在边界扫描测试方面，介绍了利用EDA工具的详细设计流程。

For BSD , it introduces the specific design flow by EDA tools .

基于边界扫描的SoC测试技术也有较为成熟的研究。

The studies on the boundary scan based SoC testing technology turn out to be relatively mature .

基于JTAG标准的边界扫描结构在一款通用CPU中的设计

A JTAG Compliant Boundary Scan in a General-Purposed CPU

首次采用先进的边界扫描技术实现了以无打扰的方式完成CPU模块的故障检测。

The CPU module 's fault is detected in no-disturb way for the first time with the advanced boundary scan technology .

边界扫描SRAM簇板级互连测试研究

SRAM cluster of boundary scan interconnect testing at board level

而边界扫描技术作为一种国际通用的测试标准，为提高系统的可测试性提供了一种可行的解决途径，已经成为系统级、板级以及内部测试（BIT）的一种重要技术。

The testing method based on boundary scan which is an international generic testing standard can provide a feasible solution to improve the testability of the electronic system .

该方法综合应用了边界扫描置位技术，可以提高电路的可控性和可观察性，进而改善PCB的可测性。

This method integrates Boundary Scan and Scan Set and improves the testability of PCB including controllability and observability .

基于边界扫描的非完全BS电路板测试诊断技术

The Test & Diagnosis Techniques of Part - BS Board Based on Boundary Scan

边界扫描测试&复杂MCM的主流测试技术

The Boundary Scan test & A Main Stream Test Technology for Complex MCM

针对在FPGA芯片中的应用特点，设计了一种边界扫描电路，应用于自行设计的FPGA新结构之中。

A boundary scan circuit is designed based on the characteristics of FPGA 's. The circuit is used in a self-designed new architecture of FPGA .

边界扫描测试技术很好地解决了VLSI电路诊断、测试的困难问题，得到了广泛的应用。

Boundary-Scan test technology well resolved the problem of VLSI circuitry diagnosis and test and has gained broad applications .